Quality Measurement Conference
 
Quality Measurement Conference

Schedule

Monday, April 28 - Workshops

7:30 am - 8:00 am Continental Breakfast / Registration
8:00 am - 12:00 pm

Precision GD&T
Dr. Greg Hetland
International Institute of GD&T

CMMs: From Construction and Control to Strategies and Performance
Ed Morse
University of North Carolina-Charlotte

Practical NDT Technology Use in Manufacturing - Eddy Current, Infrared, Leak Testing, Ultrasonics
George Moran
Non-Destructive Testing Management Association

12:00 pm - 1:30 pm

Lunch

1:30 pm - 5:00 pm

Workshop continued

Workshop continued Workshop continued
5:30 pm - 6:30 pm

Cocktail Reception
Sponsored by:

Tuesday, April 29 - General Sessions

7:00 am - 8:00 am Continental Breakfast / Registration
8:00 am - 8:10 am "Welcome Address"
Thomas Sloma Williams

Quality Magazine
8:10 am - 8:55 am Keynote:
"Heavy Industrial Manufacturing Supply Chains, Globalization and Quality"
Dean Beutel
Caterpillar Corporation
8:55 am - 9:40 am "Accreditation vs. Certification - Manufacturing vs. the Lab"
Roger Muse
ACLASS-ANAB
9:40 am - 9:50 am Solutions Showcase
9:50 am - 10:00 am Solutions Showcase
10:00 am - 10:25 am Break
10:25 am - 11:10 am Measurement System Analysis for Online Measurement of Continuous Processes
Dennis Monroe
Juran Institute Inc.
11:10 am - 11:55 am Finding the Pulse of Your Process: A New Way to Monitor Manufacturing Quality
Paul Hogendoorn
OES Inc.
11:55 am - 12:05 pm Solutions Showcase
12:05 pm - 12:15 pm Solutions Showcase
12:15 pm - 1:30 pm

Lunch
Announcement of 2008 Quality Plant of the Year & Professional of the Year Award Winners
-Plant of the Year: Van Dyke Transmission Plant of Ford Motor Co., Sterling Heights MI
-Professional of the Year: Peter Sanderson, President, TQMS Inc.
Sponsored by:

1:30 pm - 2:15 pm

Standardizing the Metrology Community
Ray Admire
Lockheed Martin MFC

Trends in Nondestructive Technology and Practice
Betsy Blazar
ASNT
2:15 pm - 3:00 pm

Coatings Cpk Success Story
Stephen Gaiski
Zestar Corp.

Myths vs. Reality in Computed Radiography Image Quality
Steve Mango
Carestream Health Inc.
3:00 pm - 3:30 pm

Break

3:30 pm - 4:15 pm

Applied Ultra Precision CMM with Optical Scanning
John Horwell
Hexagon Metrology

“Handheld XRF for Screening, Verification and Analysis of Metal Alloys, Electronics and Consumer Goods
Mark Lessard
Thermo Fisher Scientific
4:15 pm - 5:00 pm

State-of-the-Art Error Compensation
Pat Nugent
Mahr Federal

Closing the Loop on the Manufacturing Process
Bill Keely
Quantech / NDT Technologies
5:00 pm - 7:00 pm

Welcome Reception w / Exhibits
Sponsored by:

Wednesday, April 30 - General Sessions

7:30 am - 8:30 am Continental Breakfast / Registration
8:30 am - 8:40 am "Introduction & Greeting"
Thomas Sloma Williams

Quality Magazine
8:40 am - 8:50 pm Solutions Showcase Coherix
8:50 am - 9:35 am Keynote:
Tales of Failures and Calamities -- Inspecting, Measuring, Preventing, and then Dealing with Ambulance Chasers
Dr. Kenneth C. Russell
Massachusetts Institute of Technology
9:35 am - 10:20 am Building a Superior Truck: How Freightliner Uses Quality to Make a Difference for the Customer
Mike McCurry
Freightliner LLC
10:20 am - 10:45 am Break
10:45 am - 11:30 am Multisensor Metrology Cuts Manufacturing Costs
William Verwys
Optical Gaging Products Inc.
11:30 am - 12:15 pm Enabling Better Quality Data Through Wireless Technologies
Jeff Wilkinson
The L.S. Starrett Co.
12:15 pm - 1:30 pm

Lunch

1:30 pm - 2:15 pm

Information Exchange Standards Save Everyone Time, Money, and Quality
John Horst
NIST

Process Compensated Resonant Testing (PCRT): Best Practices from Multiple Applications of Structural Production NDT
Lem Hunter
Magnaflux Quasar
2:15 pm - 3:00 pm

Optimization of CMM Scanning
Pamela Moor
Y-12 National Security Complex at Oak Ridge

Precision Measurement of Hidden Surfaces with High-Resolution Computed Tomography
Kathleen Brockdorf
phoenix|x-ray Systems + Services Inc.
3:00 pm - 3:45 pm

Leveraging Your Suppliers’ Measurement Data to Improve Product Quality
Douglas Fair
Infinity QS

Improved Inspections with Ultrasonic Phased-Arrays
Michael Moles and Daniel Kass
Olympus NDT
3:45 pm - 4:15 pm

Break

4:15 pm - 5:00 pm

Panel Discussion: Quality and NDT Technicians and Experts -- Developing the Next Generation
Moderator: Tom Williams, Publisher, Quality Magazine and NDT
Panelists: Dr. Rod Casto, University of South Florida / Florida High Tech Corridor Council
Mike McCurry, Daimler Trucks North America / Freightliner
George Moran, Non-Destructive Testing Management Association
Edward Morse, NIST / UNC-Charlotte
Roy Street, Lockheed Martin

6:00 pm - 10:00 pm

Networking Dinner Aboard The StarLite Majesty Cruise Ship - All Registered Attendees Welcome. Guest tickets additional - see Guest/Spouse Options.
Sponsored by:
Coherix

Thursday, May 1 - Workshops

7:30 am - 8:00 am Continental Breakfast / Registration
8:00 am - 12:00 pm

"Measurement Uncertainty for Coordinate Measuring Machines"
Jon Baldwin
MetroSage LLC

PLANT TOUR
"Lockheed Martin Electronics Systems Manufactuirng Facility"
Steven Hill
Lockheed Martin
"Ultrasonic Precision Thickness Gages - Fundamentals and Best Practices in Manufacturing Applications"
Daniel Kass
Olympus NDT
12:00 pm - 1:30 pm

Lunch

1:30 pm - 5:00 pm

Workshop continued

   

For more conference topics on measurement, test and inspection, click here to visit the Quality Measurement Conference program
 
 
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