Dean Beutel
Director of Technical Resources
Caterpillar Corp.

Caterpillar is competing from a U.S. base in a high velocity world wide marketplace. This presentation focuses on the impact of supplier and production quality - and its impact on competitiveness within U.S. industry in general, and Caterpillar in particular. Specific topics discussed will be the Caterpillar Production System and its relentless pursuit to eliminate waste, as well as Caterpillar's efforts to ensure continued supply of top quality products to their customer base around the world. Also, the importance of having a balanced portfolio of Quality Costs will be discussed.

Ray Admire
Lockheed Martin MFC

Ray will explain the DMSC's (Dimensional Metrology Standards Consortium) role in standardizing the Quality Planning, Dimensional Planning and Dimensional Reporting formats for analysis and statistical process improvement including on-machine probing. He will also provide historical events and future plans for the metrology community for contact and non-contact metrology devices.

Ray will explore the individual roles of participation that is necessary by providers and users alike to ensure that gaps and overlays of standards are addressed by the standards community to provide a standard infrastructure that will benefit all.

John Horst
NIST

The argument for the value of information exchange standards is straightforward:

• The information incompatibility problem in manufacturing metrology is costly to everyone: vendors, suppliers, end users, and customers
• A mandated single-vendor solution is currently a popular solution to information incompatibilities, but is accompanied by a multitude of non-value-added costs that are substantial and persistent
• The standards solution is the best long term solution to information incompatibilities, since standards have no non-value-added costs and afford freedom for users and suppliers
• Standards development efforts need a modest amount of funding and leadership from tier suppliers and end users, which automatically guarantees participation from vendors and government standards experts
• Standards are the superior solution only to the degree that the standard and its implementations are verifiably correct, complete, unambiguous, and timely. However, each of these requirements is attainable. Support from government standards experts can help ensure success.

Pat Nugent
Vice President of Metrology Systems
Mahr Federal

Over the past several decades, one of the revolutions in the design of metrology systems has been in the use of error compensation algorithms to increase the accuracy and reduce the cost of manufacturing. Many years ago machines were painstakingly built to create as nearly perfect axes of motion as possible. Throughout the 1980’s, as the use of computer systems became prevalent in the operation of systems, the possibility to perform error compensation through software allowed remaining errors of motion to be compensated. These types of algorithms typically involved the one time measurement of a system and the storage of the measured values as data files on the computer. Then when measurements were performed with the systems, the data was read from these files and an offset value was added to the measured value to compensate for the machine errors. More recently a number of systems have appeared that go far beyond this simplistic approach and actually take into account all dynamic errors of the systems to achieve a far higher level of accuracy than previously thought possible. These systems account not only for the static errors in the individual axes, but also account for dynamic errors caused by the speed of motion of the system, changing center of mass in the system, and dynamic bending effects of elements in the machine.

This presentation will briefly review the history of error compensation method developments and focus on state-of-the-art methods to perform dynamic error compensation. Methodology for performing dynamic error compensation will be detailed and explained. In closing, a few thoughts regarding future direction of the development of error compensation methods will be discussed.

John Horwell
Hexagon Metrology

Applied surface profile and roughness reference measurement with ultra high accuracy CMM

• History of measuring optical surfaces
• Progression to current technology
• Applying traditional CMM for support of optical manufacturing using new optical sensor for surface scanning and roughness reference measurements.
• Application examples using standard tactile probing verses advancements in the non-contact sensor area
• Comparison between contact and non-contact results for qualifying large and small precision surfaces.
• Issues that affect measurement using low force scanning technology
• Correlation between contact and non-contact surface profile measurements
• Throughput concerns
• Discussion related to measurement issues and tactics for surface profile measurement supported by actual test data
• Traceability
• Standards - currently being addressed
• Correlation of surface finish on a CMM with Surface Finish Testers
• Traceability
• Set-up factors
• Measurement and evaluation of waviness
• Combining tactile and optical sensor for the measurement of Gears and surface finish for lead and profile
• Obtaining more information from a CMM relative to issues related to gear manufacturing
• Standard formats plus surface finish

Pamela Moor
Y-12 National Security Complex at Oak Ridge

International standards require that dimensional inspection operations include an assessment of measurement uncertainty. Scanning coordinate measuring machines (CMMs) are frequently used to measure part surfaces and features, and there is a continuing need to improve their performance for high precision measurement applications. This research provides a mechanism for minimizing the uncertainty of measurements made with a CMM in scanning mode by developing a model of CMM scanning that allows selection of optimum scanning parameters.

The method for selecting scanning parameters is based on models developed from measurements of a ring with a constant five micrometer amplitude swept sine wave machined on the inner and outer diameters. The inputs to the model are the scanning force, scanning speed, low-pass filter cut-off frequency, rotary table action, probe tip diameter, and ring orientation. The methods used in this work are based on techniques developed for point-to-point probing. The research develops models of CMM scanning operations based on measurements of the wavy ring and generates a measurement protocol to select scanning parameters based on these models.

Douglas Fair
Infinity QS

As the supply chain is playing an increasingly prominent role in business vitality, manufacturers have been incorporating supplier rating systems that provide greater transparency into their quality records. While some organizations rely strictly upon supplier certificates of analysis (COA’s) or some internal supplier rating score to manage their suppliers, there is often a discrepancy with the actual findings at incoming inspection. While incoming inspections can usually detect problems before additional steps occur, they are time-consuming, costly, and performed after-the-fact.

A much more efficient way of managing supplier quality is to do so while the products are being manufactured on the supplier’s plant floor. This can be accomplished by accessing the supplier’s quality measurement data. Using collaborative technology to facilitate the communication and share data in real-time, manufacturers and their suppliers can work together to ensure that the products meet specifications prior to being purchased and delivered.

In this presentation, learn how to securely access your suppliers’ quality measurement data so that you can work with them to address quality issues in real-time. Hear how one major manufacturer is systematically reducing the time and expense of poor supplier quality by using real-time technology for instantaneous data sharing and analysis.

Stephen Gaiski
Zestar Corp.

Stephen will explore how an automotive manufacturer's paint department focused on increasing their throughput rate by improving their Cpk performance from measurements obtained with a NDT Gauge. Cpk is a statistical index that indicates whether a process will consistently produce an item that is centered within tolerance limits. Index is analogous to an arrow consistently hitting the bull's-eye.

An NDT Gauge was used to obtain film thickness measurements. Objective was to produce manufactured units with a film having a thickness centered within tolerance limits. Cpk's were obtained from statistical process control charts which track coating processes by plotting data over time. Subsequently, a technology utilizing a computer implemented process was used, that anticipated the effect of Cpk for optimizing coatings usage and costs. Nonrandom patterns of film build variability were referenced to OEM's world class standards.

Cpk values per panel per coating fiscally converted, benchmarked and forecasted. Actions initiated based on Cpk fiscal performance. Significant qualitative and quantitative improvement results were achieved in three significant areas: 1) Throughput Rate, 2) Prime Coat Cpk Value and 3) Annualized Savings.

Dennis Monroe
Juran Institute Inc.

This presentation will discuss the unique challenges of conducting Measurement Systems Analysis (MSA) for continuous processes such as extrusion, glass making, or materials coating where online measurement is required or desirable.

It can be difficult to assess measurement error in terms of bias, repeatability, and reproducibility for such processes because once the product passes through the online inspection point, it's gone. Creative solutions to this difficulty will be discussed in this presentation. These solutions will allow valid analysis of these measurement systems.

Paul Hogendoorn
OES Inc.

Most manufacturers measure or test parts to verify that the parts meet quality standards. This conventional approach is time-consuming because testing adds steps and time to the production process, and it is only as good as the sample size. A different approach to quality is to use an in-process monitor to capture the “signature” of the process, and then compare the signature of each production cycle with a reference of known good parts as a way to monitor the manufacturing process. The key to a successful in-process monitoring system is the selection of the most appropriate sensor to “find the pulse of the process”.

The unique characteristics of process variation monitoring will be presented to demonstrate how nearly all fabricators can benefit. Case examples will show how to monitor 100 percent of production without adding time or processing steps. The presentation will outline the benefits of early detection of process variation that can lead to defective parts, preventing further processing and saving production time and reducing scrap costs. Most importantly, all personnel - maintenance, production, and management – will understand to focus on the process, rather than on parts, which facilitates sustainable gains in efficiency, scrap reduction, and quality.

Mike McCurry
Freightliner LLC

William Verwys
Optical Gaging Products Inc.

Dimensional measurement systems that combine two or more sensor technologies are capable of measuring more dimensions of manufactured parts than is possible on single sensor machines. This improves overall throughput and minimizes bottlenecks in the quality process, reducing total costs.

The presentation will explain how a combination of sensors uses the strengths of each to collect data that is then analyzed as a whole to construct dimensional and angular relationships.

Jeff Wilkinson
The L.S. Starrett Co.

Jeff will discuss wireless data collection and how it enables better qualitative and quantitative results in lab, shop floor and in-line inspection applications. Current practice of recording QC/QA data via pen and paper and wired gaging, have inherent limitations and can be prone to human error. Further, the paper will show how these practices cause human error and ultimately compromised production quality.

With the maturity and ubiquitous nature of wireless communications today, these technologies give rise to new and varied applications. Here, wireless technology is applied to hand held and bench top gaging to enable fast, accurate and complete data sets. As a result, measurement becomes feasible and cost effective for 100% in-line inspection.

Moderator:
Tom Williams
Quality Magazine and NDT

Panelists:
Dr. Rod Casto, University of South Florida / Florida High Tech Corridor Council
Mike McCurry, Daimler Trucks North America / Freightliner
George Moran, Non-Destructive Testing Management Association
Edward Morse, NIST / UNC-Charlotte
Roy Street, Lockheed Martin

The challenges for implementers of new and better quality measurement and NDT solutions never end. And as the technology continues to improve, the skill levels needed to operate the new instruments and equipment often also increases. But recent evidence indicates that not enough qualified technicians may be available in the future to meet both the projected manpower needs and the skill requirements.

This feature panel discussion, including users and developers of quality measurement and NDT equipment as well as educational leaders, will provide a broad perspective on causes of the projected manpower and skills gap and various initiatives to close the gap. Discussion topics may include changing skill requirements for measurement and NDT applications, technical training programs, emerging system and automation technologies, and the expectations of users and implementers of new technologies in inspection in manufacturing. Using a discussion and Q&A format, it will address issues of interest to all manufacturers, from large-scale industrial products to medical devices to electronics to precision machined components.

Betsy Blazar
Sr. Manager, Marketing & Membership
American Society for Nondestructive Testing, Inc.

In the session, Nondestructive Trends in Technology and Practice, Betsy Blazar will discuss results and "take aways" from a recent market study of ASNT's membership as well as Society activities which have relevancy to an NDT and quality focused audience. Covered will be the challenges confronting the nondestructive testing industry today and those anticipated in the future.

Bill Keely
Quantech / NDT Technologies

In the extremely competitive manufacturing market that is prevalent in the US today, if American companies are to remain competitive, tool life must be maximized while scrap and scrap related costs are minimized. One means of insuring that this happens is to "Close The Loop on the Manufacturing Process" by automatically inspecting parts immediately after they are machined. If this is accomplished, in-process changes can be made immediately, as the manufacturing process commences, rather than after the fact when the problem is detected in a subsequent machining or assembly operation.

Eddy current inspection techniques offer many capabilities in this area. Using this and related technologies, parts can be 100% inspected, immediately after they are machined, for: thread presence and condition; boar dimensions, clindricity, ovality, taper and surface finish; wall thickness; materials porosity; part run-out; presence and dimensions of intersecting holes, undercuts and chamfers; as well as much more.

Michael Moles and Daniel Kass
Olympus NDT

Ultrasonic phased arrays are a relatively new technology, and have become much more commercial with the recent arrival of portable phased arrays instruments. Phased arrays are primarily a method of generating and receiving ultrasound, but are also an imaging method. Phased arrays can perform unique scans, such as S-scans (or sectorial scans) and E-scans (or electronic scans). The instruments are also very flexible, and can be used in manual, semi-automated or fully automated scanning modes. In addition, set-ups are digital, so changes are easy to implement. Encoded, or scans with full data recording, permit full auditing, which is a major asset for quality control. As a result, phased arrays are extensively used for the traditional NDE applications of weld inspections and corrosion mapping, as well as a variety of special applications. This paper will describe how phased arrays work, where phased arrays can be beneficial, and where phased arrays are in terms of acceptance.

Mark Lessard
Thermo Fisher Scientific

The need to conclusively verify material composition and to confirm compliance with as-designed specifications reaches through many areas of industry. Once the exclusive provenance of lab-based instrumentation, improvements in the miniaturization of electronics – and the ability to apply these advances to platform development have succeeded in bringing the laboratory to the field.

Advances in the field of handheld XRF (x-ray fluorescence) now permit statistically representative sampling of non-critical systems, while providing the speed and analytical performance to permit 100% verification of critical-use systems. By doing so, it eliminates sole reliance on mill test reports or vendor certifications, and prevents material mix-ups with consequences ranging from costly to catastrophic.

This presentation will include an overview of the XRF technique, discuss the recent technological advances and their direct application to PMI (positive material identification). It will contain specific industry examples, including the metal alloy manufacturing environment, operating petrochemical refineries, and aerospace applications, and conclude with recent examples of the application of this technology for the non-destructive testing of consumer goods.

Lem Hunter
Magnaflux Quasar

Process Compensated Resonant Testing (PCRT) has matured as a practical and cost effective NDT method that consistently outperforms older methods in classifying production parts by structural acceptability. Used on materials ranging from aluminum to iron to ceramics and with various fabrication methods, PCRT proves especially effective in online production testing applications. This paper synthesizes lessons learned in applying PCRT to production NDT applications in a set of PCRT Best Practices guidelines. Particular focus is placed on comparisons of PCRT to traditional NDT methods in terms of effectiveness in detecting and rejecting structurally unacceptable parts. Data is presented demonstrating how PCRT decreases waste by minimizing false rejects while enhancing the quality of the product stream.

Steve Mango
Carestream Health Inc.

With an increasing rate of NDE operations transitioning from analog to digital technologies, such as computed radiography, users are learning that there’s more to digital image quality than meets the eye. There are many factors that determine the final perceived image quality of a computed radiograph. Many are misunderstood, and some are often touted as the “key parameter” or “magic bullet” in producing optimum image quality. In fact, such claims are oversimplified, and are more marketing hype than reality. The final perceived image quality results from the cascaded effects of many factors such as sharpness, system noise, spot size and pixel size, subject contrast, bit depth, radiographic technique, and so on. Many of these factors are within our control, either as a radiographer or a designer of equipment and media. This paper will explain some of these key factors, dispel some of the myths surrounding them, and will show that bigger, smaller, more, or less is not always better when it comes to CR image quality.

Kathleen Brockdorf
phoenix|x-ray Systems + Services Inc.

High-resolution Computed Tomography (CT) widely expands the spectrum of detectable internal defects as well as the possibilities for non destructive measurements of hidden internal surfaces of complex objects which are currently inaccessible with conventional Co-ordinate Measurement Machines. The new nanotom® is the first 180 kV nanoCT® system with the capability to analyse samples with the exceptional resolution of less than 0.5 microns voxel. Thus object surfaces of – for example – molded plastics or small light metal parts can be visualized and precisely measured.

The volume data of the object is used to extract surfaces. The generated data is measured by fitting of geometrical primitives or by variance analysis against CAD-data. It may also be used for reverse engineering. In order to ensure geometrically correct surfaces, innovative extraction methods have been added to the surface|extraction-module of the CT software. To determine the accuracy of metrology with CT, a test object calibrated by the German Metrology Institute, was scanned with different high resolution CT-systems. In the paper the results are presented.

High resolution CT opens a new dimension of 3D-micromeasurement. For first-article-inspection and process control it will partially substitute traditional destructive methods as well as the many times slower acquisition of three-dimensional metrology by conventional Co-ordinate Measurement Machines.